S.P.M. van Nuffel, Ph.D.
Sebastiaan Van Nuffel is an Assistant Professor (UD) at the Faculty of Science and Engineering as well as the M4I Division of Imaging Mass Spectrometry. Throughout his scientific career, he has built up an extensive expertise in imaging mass spectrometry (IMS) with a special emphasis on time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application in biological and medical research.
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