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Electron microscopes

FEI Tecnai Arctica

  • A 200kV FEG cryo transmission electron microscope.
  • Mainly used for 3-dimensional structural elucidation of biological samples.
  • Equipped with a FEI Falcon III 4k Direct-Electron Detector (DED) and a Gatan Orius 2K CCD camera.
  • Holds a 12-grid autoloader system for the loading/screening of multiple grids and Volta phase plates for enhancement of the contrast in images taken at focus.
  • High-resolution image acquisition of single particles is achieved by FEI EPU, whereas electron tomography is automated by FEI Tomo4.
Microscopy CORE Lab Tecnai Arctica

Two FEI Tecnai G2 Spirit BioTWINs

  • 120kV transmission electron microscopes.
  • Equipped with FEI Eagle 4k CCD cameras for image acquisition.
  • Run the FEI EPU and Tomo4 software packages for automated single-particle data collection and 3-dimensional electron tomography.
  • Multiple Gatan side-entry (high-tilt) cryo-holders are available to enable data acquisition under low-dose cryo-conditions.
  • Used for the room-temperature observation and tomography of sections cut from embedded samples, as well as the screening of samples for single-particle EM, prepared by negative staining.
  • For acquisition of large field-of-view images, the tiles-acquisition program EM mesh has been installed.
Microscopy CORE Lab Tecnai Spirit

FEI Scios DualBeam

  • High resolution FEG volume and (cryo-) dual beam scanning electron microscope (SEM).
  • Contains an additional column which generates a focused ion beam (FIB).
  • Whereas the electron beam is used to obtain high resolution images of the sample, the FIB can be used to remove material from a sample as well as image and depose platinum via the gas injection system (GIS).
  • Runs FEI Auto Slice and View to successively remove and image thin slices of a sample in order to achieve 3-dimensional reconstructions of large areas within the volume.
  • Can mill thin lamellae of frozen-hydrated cells which afterwards are reconstructed by cryo-electron tomography.
  • The program FEI MAPS is installed by which correlative microscopy images can be overlaid onto SEM images to position the milling process at the region-of-interest that was defined before by fluorescence microscopy.
Microscopy CORE Lab Scios Dualbeam

Jeol JSM-IT200 InTouchScope

  • A 200V-30kV scanning electron microscope (SEM).
  • Provides both secondary and backscattered electron imaging.
  • Equipped with energy dispersive x-ray detector (EDAX) for analytical mapping of elements. 
Microscopy CORE Lab IntouchScope